Room temperature strain-induced Landau levels in graphene on a wafer-scale platform

Authors P. Nigge, A.C. Qu, E. Lantagne-Hurtubise, E. Marsell, S. Link, G. Tom, M. Zonno, M. Michiardi, M. Schneider, S. Zhdanovich, G. Levy, U. Starke, C. Gutierrez, D. Bonn, S.A. Burke, M. Franz, A. Damascelli
Volume / Issue 5
Pages / Article ID eaaw5593
Year 2019
Scroll to Top